Jae Woo Lee

发表

Degradation pattern of black phosphorus multilayer field−effect transistors in ambient conditions: Strategy for contact resistance engineering in BP transistors

Gyu-Tae Kim, Jae Woo Lee, H. Jang, 2017 .

Impact of trap localization on low-frequency noise in nanoscale device

G. Ghibaudo, W. Yun, Jae Woo Lee, 2014 .

An improved AFM cross-sectional method for piezoelectric nanostructures properties investigation: application to GaN nanowires

Thierry Baron, Xin Xu, Laurent Montès, 2011, Nanotechnology.

Quantitative temperature measurement of an electrically heated carbon nanotube using the null-point method.

Jaehun Chung, Kyeongtae Kim, Ohmyoung Kwon, 2010, The Review of scientific instruments.

Low-frequency noise in junctionless multigate transistors

Jean-Pierre Colinge, Gerard Ghibaudo, Chi-Woo Lee, 2011 .

Low-frequency noise in strained SiGe core-shell nanowire p-channel field effect transistors

G. Ghibaudo, T. Ernst, K. Tachi, 2010 .

Electrical properties of high density arrays of silicon nanowire field effect transistors

G. Duesberg, Hye-Young Kim, Kangho Lee, 2013 .

The electrical characteristics of high density arrays of silicon nanowire field-effect transistors: Dependence on wire spacing

G. Duesberg, Hye-Young Kim, Kangho Lee, 2013, 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013).

Degradation pattern of SnO2 nanowire field effect transistors

Daeil Kim, J. Ha, In-Sung Hwang, 2010, Nanotechnology.

Mobility analysis of surface roughness scattering in FinFET devices

Gerard Ghibaudo, Mireille Mouis, Thomas Chiarella, 2011 .

Fabrication of $V_2O_5$ Nanowire/PVA (Polyvinyl Alcohol) Composites for the Electric Applications

Kangho Lee, Gyu-Tae Kim, Jae Woo Lee, 2009 .

Source/drain induced defects in advanced MOSFETs: what device electrical characterization tells

G. Ghibaudo, M. Mouis, D. Jeon, 2014 .