Saipeng Wong

Stable properties of Ti:sapphire laser

Zhenxin Yu, Wing-Kee Lee, Xu G. Huang, 1995, Photonics West.

Spectroellipsometric study of optical and electrical properties of buried CoSi2 layers in silicon produced by MEVVA implantation

Wensheng Guo, Ziqing Zhu, Saipeng Wong, 1998, Other Conferences.

Characteristics and distributions of interface trap for novel SiOxNy thin dielectric film material

Saipeng Wong, P. Sheng Chen, 1994, Thin Film Physics and Applications.

Spectroellipsometric study of SiC/Si heterostructures produced by MEVVA implantation

Wensheng Guo, Ziqing Zhu, Saipeng Wong, 1998, Other Conferences.

Spectroellipsometric study of diamondlike carbon films

Wensheng Guo, Ziqing Zhu, Saipeng Wong, 1998, Other Conferences.