A. Kishida

Total dose dependence of soft-error hardness in 64 kbit SRAMs evaluated by single-ion microprobe technique

T. Matsukawa, I. Ohdomari, S. Matsuda, 1994 .

Radiation immunity of pMOSFETs and nMOSFETs examined by means of MeV He single ion microprobe

T. Matsukawa, I. Ohdomari, M. Koh, 1996 .

Radiation effects induced by high energy He single ions at Si/SiO2 interfaces

T. Matsukawa, I. Ohdomari, M. Koh, 1994 .