M. Goto

Total dose dependence of soft-error hardness in 64 kbit SRAMs evaluated by single-ion microprobe technique

T. Matsukawa, I. Ohdomari, S. Matsuda, 1994 .

Radiation effects induced by high energy He single ions at Si/SiO2 interfaces

T. Matsukawa, I. Ohdomari, M. Koh, 1994 .

Evaluation of single-event immunity in micron-size device area using single-ion microprobe technique

I. Ohdomari, M. Koh, K. Hara, 1993 .