H. Wurzer

Influence of gate oxide breakdown on MOSFET device operation

I. Eisele, Martin Kerber, Helmut Wurzer, 2000 .

Influence of Oxide-Damage on Degradation-Effects in Bipolar-Transistors

W. Bergner, R. Mahnkopf, H. Klose, 1993 .

Differences in the hot-carrier degradation of fully depleted n-channel MOSFETs on SIMOX/BESOI substrates

R. Mahnkopf, G. Abstreiter, S. Pindl, 1997, 1997 IEEE International SOI Conference Proceedings.

[Hypothermic pulsatile perfusion of canine kidneys. The course of the lactate-pyruvate ratio in various experimental conditions].

R. Grundmann, H. Wurzer, H. Pichlmaier, 1972, Research in experimental medicine. Zeitschrift fur die gesamte experimentelle Medizin einschliesslich experimenteller Chirurgie.

Characterization of photopyroelectric vapour analysis

W. Rumpler, H. Wurzer, 1995 .

Soft breakdown and hard breakdown in ultra-thin oxides

M. Kerber, C. Engel, H. Wurzer, 2001, Microelectron. Reliab..

Optimization of tissue interaction in electrosurgery

Hans-Dieter Liess, Juergen Lademann, Rainer Maeckel, 1996, European Conference on Biomedical Optics.

Annealing of degraded npn-transistors/spl minus/mechanisms and modeling

R. Mahnkopf, H. Klose, H. Wurzer, 1994 .

A spark counter as a control unit of a radio frequency surgery device

H.-D. Liess, H. Audring, J. Lademann, 1997, IEEE Transactions on Biomedical Engineering.

Contribution of interface traps to valence band electron tunneling in PMOS devices

M. Kerber, I. Eisele, H. Wurzer, 2000, 30th European Solid-State Device Research Conference.