Patrick G. Drennan

Technique for the measurement of the in-situ development rate

Bruce W. Smith, David W. Alexander, Patrick G. Drennan, 1994 .

INTEGRATED CIRCUIT DEVICE MISMATCH MODELING AND CHARACTERIZATION FOR ANALOG CIRCUIT DESIGN by

D. K. Schroder, Patrick G. Drennan, Corey Gehman, 1999 .

Implications ofProximity Effects forAnalog Design

Patrick G. Drennan, M. L. Kniffin, D. R. Locascio, 2006 .

Analog/Mixed-Signal Design in FinFET Technologies

Sam Yang, Li Sun, Bo Yu, 2018 .

A Web Tool for Interactive Exploration of Analog Design Tradeoffs

Colin C. McAndrew, Cynthia L. Recker, Brandt Braswell, 2006, IEEE Custom Integrated Circuits Conference 2006.

Implications of Proximity Effects for Analog Design

Patrick G. Drennan, M. L. Kniffin, D. R. Locascio, 2006, IEEE Custom Integrated Circuits Conference 2006.

Extraction of process specific photolithography model parameters

Bruce W. Smith, Patrick G. Drennan, 1994 .

Device Correlation: Modeling using Uncorrelated Parameters, Characterization Using Ratios and Differences

Colin C. McAndrew, Patrick G. Drennan, 2006 .