A. Kramer

In Situ Application Of Electronic Speckle Pattern Interferometry (ESPI) In The Investigation Of Stone Decay

G. Gulker, K. Hinsch, C. Holscher, 1990, Optics & Photonics.

In-Situ Investigations Of Deformations Of Natural Stones By Electronic Speckle Pattern Interferornetry (ESPI)

G. Gulker, K. Hinsch, C. Holscher, 1988, Other Conferences.

The Investigation Of Deformations Of Natural Stones Under Test-Conditions By Electronic Speckle Pattern Interferometry (ESPI)

G. Gulker, K. Hinsch, C. Holscher, 1988, Other Conferences.

Deformation Measurements Of Natural Stones In-Situ By Electronic Speckle Pattern Interferometry (ESPI)

G. Gulker, K. Hinsch, C. Holscher, 1989, Other Conferences.