D. Lu

Correlation between internal states and creep resistance in metallic glass thin films

C. J. Li, S. Ketov, M. Călin, 2021 .

Critical thickness for cracking of Pb(Zr0.53Ti0.47)O3 thin films deposited on Pt/Ti/Si(100) substrates

Tong-Yi Zhang, MingHao Zhao, Ran Fu, 2002 .

Determination of residual stresses in Pb(Zr0.53Ti0.47)O3 thin films with Raman spectroscopy

Tong-Yi Zhang, Tong-Yi Zhang, Wei-hua Xu, 2001 .

Fatigue in thin-film ferroelectrics: simulation by a modified diffusion-limited aggregation model with drift

H. Gu, D. Lu, Xingjiao Li, 1995 .

Computer Simulation of Fatigue in Ferroelectric Thin Films by a Modified Diffusion Limited Aggregation Model with Drift

Longbo Huang, D. Lu, Xingjiao Li, 1995 .