Paul Reuter

High-frequency, at-speed scan testing

Janusz Rajski, Nagesh Tamarapalli, Bruce Swanson, 2003, IEEE Design & Test of Computers.

Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm

Nilanjan Mukherjee, Sudhakar M. Reddy, Wu-Tung Cheng, 2002, Proceedings. International Test Conference.

CTL the language for describing core-based test

Rohit Kapur, Brion L. Keller, Maurice Lousberg, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

A Framework for Model-Based Tracking Experiments in Image Sequences

Hans-Hellmut Nagel, Hendrik Dahlkamp, Paul Reuter, 2007, International Journal of Computer Vision.

CTL and Its Usage in the EDA Industry

Rohit Kapur, Brion L. Keller, Sandeep Bhatia, 2009, IEEE Design & Test of Computers.