Sheng-Che Lin

发表

Mechanism and annihilation of shallow-trench-isolation-enhanced poly-mask-edge N+/P-well junction leakage

Charles Ching-Hsiang Hsu, Sunnys Hsieh, Peter Chen, 2001, Microelectronic and MEMS Technologies.

An assessment of physical and electrical design rule based statistical process monitoring and modeling (PEDR-SPMM): for foundry manufacturing line of multiple-product mixed-run

Charles Ching-Hsiang Hsu, Sunnys Hsieh, K.Y.-Y. Doong, 2002, Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002..

The Quantitative Analysis of Thermography to Evaluate Palmar Circulation: An Experiment Model and a Preliminary Study of Normal Subjects

Chii-Jeng Lin, Sheng-Che Lin, Haw-Yen Chiu, 1997 .

Motion analysis of mouth movement utilizing challis technique-experiment model and clinical study using video-based system

Fong-Chin Su, You-Li Chou, Sheng-Che Lin, 2002 .

Fast Surface Registration Based on Feature Area Detection

Sheng-Che Lin, Chia-Hsiang Wu, Cheng-Min Ni, 2012, 2012 International Symposium on Computer, Consumer and Control.

LOGIC product yield analysis by Wafer Bin Map pattern recognition supervised neural network

Sheng-Che Lin, K. L. Young, F. L. Chen, 2003 .

Field-Configurable Test Structure Array (FC-TSA): Enabling Design for Monitor, Model, and Manufacturability

Chien-Chih Liao, K.L. Young, Sheng-Che Lin, 2008, IEEE Transactions on Semiconductor Manufacturing.

The role of test structures for yield enhancement and yield ramp-up: an example of adoptive yield enhancement (AYE): n/sup +//p-well junction leakage enhanced the abnormal leakage current of NMOS's parasitic NPN-BJT

Charles Ching-Hsiang Hsu, Sunnys Hsieh, K.Y.-Y. Doong, 2000, Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130).

Facial surgery simulation using finite element modeling

Chia-Hsiang Wu, Yung-Nien Sun, Sheng-Che Lin, 2001, SPIE Medical Imaging.

The short-loop process tuning & yield evaluation by using the addressable failure site test structures (AFS-TS)

Sunnys Hsieh, Sheng-Che Lin, Binson Shen, 2000, Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130).

Scaling variance, invariance and prediction of design rule: from 0.25-/spl mu/m to 0.10-/spl mu/m nodes in the era of foundry manufacturing

J. K. Wang, J.Y.C. Sun, Sunnys Hsieh, 2001, 2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550).

Novel assessment of process control monitor in advanced semiconductor manufacturing: a complete set of addressable failure site test structures (AFS-TS)

Charles Ching-Hsiang Hsu, Sunnys Hsieh, Jian-Rong Wang, 1999, 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314).

Serial Kinematic and Functional Assessments for Hand Motion Impairment: A Case Report with Hand Rehabilitation for a Comminuted Proximal Phalangeal Fracture

Fong-Chin Su, Li-Chieh Kuo, Sheng-Che Lin, 2013 .

Design for manufacturability: IC layout density optimization by minimum-variance method

Fei-Long Chen, Sheng-Che Lin, Kelvin Yih-Yuh Doong, 2010 .

Addressable failure site test structures (AFS-TS) for CMOS processes: Design guidelines, fault simulation, and implementation

Ding-Ming Kwai, Charles Ching-Hsiang Hsu, Larg Weiland, 2001 .

Addressable failure site test structures (AFS-TS) for process development and optimization

Sunnys Hsieh, K.Y.-Y. Doong, Sheng-Che Lin, 2000, ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).

Replantation of Pediatric Multiple Digit Amputation Caused by an Automatic Cup-sealing Machine

Sheng-Che Lin, Wen-Ping Tsai, Haw-Yen Chiu, 2007 .