R. C. Sobers

Quantitative measurement of O/Si ratios in oxygen-sputtered silicon using 18O implant standards

K. Franzreb, P. Williams, R. C. Sobers, 2004 .

Small silicon–oxygen dianions in the gas phase

P. Williams, T. Sommerfeld, K. Franzreb, 2006 .

Formation of doubly positively charged diatomic ions of Mo2(2+) produced by Ar+ sputtering of an Mo metal surface.

J. Lorincik, K. Franzreb, P. Williams, 2004, The Journal of chemical physics.

Gas-phase diatomic trications of Se2(3+), Te2(3+), and LaF3+.

J. Hrǔsak, K. Franzreb, J. Lörinčík, 2004, The Journal of chemical physics.

Detection of the diatomic dications SiH2+ and AlH2+

P. Williams, J. Lorincik, K. Franzreb, 2004 .

On the effect of oxygen flooding on the detection of noble gas ions in a SIMS instrument

J. Lorincik, K. Franzreb, P. Williams, 2010 .

Quantitative fundamental SIMS studies using 18O implant standards

P. Williams, J. Lorincik, K. Franzreb, 2006 .