G. Fiorenza

Modeling of Alpha-Induced Single Event Upsets for 45 nm Node SOI Devices Using Realistic C4 and 3D Circuit Geometries

H.H.K. Tang, D. Heidel, K. Rodbell, 2009, IEEE Transactions on Nuclear Science.

The Economic Burden of Insulin Injection-Induced Lipohypertophy. Role of Education: The ISTERP-3 Study

A. Auletta, E. Riccio, A. Siani, 2022, Advances in Therapy.

The Durability of an Intensive, Structured Education-Based Rehabilitation Protocol for Best Insulin Injection Practice: The ISTERP-2 Study

A. Auletta, E. Riccio, A. Siani, 2021, Diabetes Therapy.

Fowler-Nordheim tunneling of carriers in MOS transistors: Two-dimensional simulation of gate current employing FIELDAY

S. Mohammad, A. Acovic, J. Johnson, 1995 .

Predicting interconnect requirements in ultra-large-scale integrated control logic circuitry

Rick A. Rand, Mary Yvonne Lanzerotti, Giovanni Fiorenza, 2005, SLIP '05.

IBM Research Report Accounting for Circuitry Type in Assessments of Wire-Length Distribution Models for ULSI Chips

Rick A. Rand, M. Y. Lanzerotti, G. Fiorenza, 2005 .

Assessment of on-chip wire-length distribution models

Rick A. Rand, M. Y. Lanzerotti, G. Fiorenza, 2004, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Microminiature packaging and integrated circuitry: The work of E. F. Rent, with an application to on-chip interconnection requirements

Rick A. Rand, Mary Yvonne Lanzerotti, Giovanni Fiorenza, 2005, IBM J. Res. Dev..

Interpretation of rent's rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models

Rick A. Rand, Mary Yvonne Lanzerotti, Giovanni Fiorenza, 2004, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Technology CAD at IBM

Jack A. Mandelman, D. Lieber, M. M. Pelella, 1993 .