D. Laffitte

Electroluminescence spectroscopy for reliability investigations of 1.55μm bulk semiconductor optical amplifier

N. Zerounian, L. Béchou, F. Aniel, 2006, IPFA 2006.

Reliability investigations of 1.55 /spl mu/m bulk semiconductor optical amplifier using functional parameter measurements

M. Renaud, L. Béchou, Y. Danto, 2003, International Conference onIndium Phosphide and Related Materials, 2003..

Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules

Jean-Yves Delétage, Yves Danto, Frédéric Verdier, 2003, Microelectron. Reliab..