A. Fujimoto

Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

Y. Ju, A. Hosoi, Lan Zhang, 2011 .

Structure modification of M-AFM probe for the measurement of local conductivity

L. Zhang, Y. Ju, A. Hosoi, 2010, 2010 Symposium on Design Test Integration and Packaging of MEMS/MOEMS (DTIP).

Measurement of electrical properties of materials under the oxide layer by microwave-AFM probe

Y. Ju, A. Hosoi, Lan Zhang, 2011, 2011 Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP).

Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization.

Akifumi Fujimoto, Yang Ju, Y. Ju, 2010, The Review of scientific instruments.

Preparation of electrically conductive nano-powder of zinc oxide and application to transparent film coating

T. Yamamoto, M. Adachi, A. Fujimoto, 2009 .