M. Fadlallah

Static and low frequency noise characterization in surface- and buried-mode 0.1 μm PMOSFETS

G. Guegan, Gerard Ghibaudo, M. Fadlallah, 2003 .

Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs

M. Zoaeter, Gérard Ghibaudo, G. Guégan, 2002, Microelectron. Reliab..

Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics

Arkadiusz Szewczyk, Gérard Ghibaudo, Frederic Monsieur, 2001, Microelectron. Reliab..

Low voltage SILC and P- and N-MOSFET gate oxide reliability

T. Maurel, C. Petit, D. Zander, 2005, Microelectron. Reliab..

Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices

M. Bidaud, Gérard Ghibaudo, C. Petit, 2003, Microelectron. Reliab..

Practical design for circularly polarized dual off-center aperture-coupled microstrip antenna for GPS application

Hussam Ayad, M. Fadlallah, Jalal Jomaah, 2014, 2014 International Conference on High Performance Computing & Simulation (HPCS).

Performances of low profile dipole antenna AMC-based surface using metamaterials structures

H. Youssef, Hussam Ayad, M. Fadlallah, 2012, 2012 19th International Conference on Telecommunications (ICT).

Design of MSRR-loaded dual-band dipole PCB antennas

Hussam Ayad, M. Fadlallah, Jalal Jomaah, 2013, ICT 2013.