Jalal Jomaah

发表

Static and low frequency noise characterization in surface- and buried-mode 0.1 μm PMOSFETS

G. Guegan, Gerard Ghibaudo, M. Fadlallah, 2003 .

3D-Printed Low-Cost and Lightweight TEM Cell

Mohammed Al-Husseini, Jalal Jomaah, Fabien Ndagijimana, 2018, 2018 International Conference on High Performance Computing & Simulation (HPCS).

Miniaturized Half-Mode Slow-Wave Substrate-Integrated Waveguide Bandpass Filter

Mohamad Khalil, Mahmoud Kamarei, Jalal Jomaah, 2019, Wirel. Pers. Commun..

Impact of floating body and BS-tied architectures on SOI MOSFET's radio-frequency performances

C. Raynaud, F. Balestra, J. Boussey, 2000, 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125).

Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs

M. Zoaeter, Gérard Ghibaudo, G. Guégan, 2002, Microelectron. Reliab..

0.25 /spl mu/m SOI technologies performance for low-power radio-frequency applications

C. Raynaud, Francis Balestra, J. Boussey, 2000, ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.00EX445).

Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics

Arkadiusz Szewczyk, Gérard Ghibaudo, Frederic Monsieur, 2001, Microelectron. Reliab..

Low frequency noise in 0.12 mum partially and fully depleted SOI technology

Sébastien Haendler, Francis Balestra, Jalal Jomaah, 2003, Microelectron. Reliab..

On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs

George J. Papaioannou, Francis Balestra, Jalal Jomaah, 2004, Microelectron. Reliab..

Impact of BOX/substrate interface on low frequency noise in FD-SOI devices

G. Ghibaudo, Jalal Jomaah, Leily Zafari, 2007, SPIE International Symposium on Fluctuations and Noise.

Shrinking from 0.25 down to 0.12 μm SOI CMOS technology node: a contribution to low-frequency noise in partially depleted N-MOSFETs

F. Balestra, Jalal Jomaah, S. Haendler, 2003 .

Substrate bias effects in SOI FinFETs

Sorin Cristoloveanu, Anne Vandooren, Jalal Jomaah, 2003 .

Comparison between fully- and partially-depleted SOI MOSFET's for low-power radio-frequency applications

C. Raynaud, F. Balestra, Jalal Jomaah, 1999, 1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345).

An overview of low-frequency noise in advanced CMOS/SOI transistors

Francis Balestra, Jalal Jomaah, J. Jomaah, 2003, SPIE International Symposium on Fluctuations and Noise.

L-Band Uavsar Tomographic Imaging in Dense Forest: Afrisar Results

Olivier Strauss, Ho Tong Minh Dinh, Nicolas Baghdadi, 2018, IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium.

Oil Thickness Estimation Using Single- and Dual- Frequency Maximum-Likelihood Approach

Ghaleb Faour, Hussam Ayad, Majida Fadlallah, 2018, 2018 International Conference on High Performance Computing & Simulation (HPCS).

Monitoring Tropical Forest Structure Using SAR Tomography at L- and P-Band

Olivier Strauss, Marco Lavalle, Ho Tong Minh Dinh, 2019, Remote. Sens..

Analysis and modeling of self-heating effects in thin-film SOI MOSFETs as a function of temperature

Gerard Ghibaudo, Francis Balestra, Jalal Jomaah, 1995 .

The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs

George J. Papaioannou, Francis Balestra, Jalal Jomaah, 2005, Microelectron. Reliab..

Snow Depth Retrieval Algorithm from Radar Backscattering Measurements at L- and X- Band Using Multi-Incidence Angles

Ghaleb Faour, Hussam Ayad, Majida Fadlallah, 2018, 2018 International Conference on High Performance Computing & Simulation (HPCS).

An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's

Francis Balestra, Jalal Jomaah, François Dieudonné, 2001, Microelectron. Reliab..

Practical design for circularly polarized dual off-center aperture-coupled microstrip antenna for GPS application

Hussam Ayad, M. Fadlallah, Jalal Jomaah, 2014, 2014 International Conference on High Performance Computing & Simulation (HPCS).

Reliability and Electrical Fluctuations in Advanced SOI CMOS Devices

Jalal Jomaah, Francis Balestra, J. Jomaah, 2005 .

Performances of low profile dipole antenna AMC-based surface using metamaterials structures

H. Youssef, Hussam Ayad, M. Fadlallah, 2012, 2012 19th International Conference on Telecommunications (ICT).

Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors

Sébastien Haendler, Gérard Ghibaudo, Jalal Jomaah, 2001, Microelectron. Reliab..

Scaling issues for advanced SOI devices: Gate oxide tunneling, thin buried oxide, and ultrathin films

Frederic Allibert, Sorin Cristoloveanu, Jalal Jomaah, 2003 .

Multi-Frequency Approach for Oil Spill Remote Sensing Detection

Ghaleb Faour, Hussam Ayad, Majida Fadlallah, 2017, 2017 International Conference on High Performance Computing & Simulation (HPCS).

DC Characterization of Different Advanced MOSFET Architectures

Gerard Ghibaudo, Jalal Jomaah, Majida Fadlallah, 2011 .

Design of MSRR-loaded dual-band dipole PCB antennas

Hussam Ayad, M. Fadlallah, Jalal Jomaah, 2013, ICT 2013.

L-Band UAVSAR Tomographic Imaging in Dense Forests: Gabon Forests

Olivier Strauss, Marco Lavalle, Ho Tong Minh Dinh, 2019, Remote. Sens..

Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs

Sébastien Haendler, Franck Arnaud, Gérard Ghibaudo, 2012, 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs

George J. Papaioannou, Francis Balestra, Jalal Jomaah, 2009, Microelectron. Reliab..

MODELING AND SIMULATION OF COUPLING EFFECT ON LOW FREQUENCY NOISE IN ADVANCED SOI MOSFETS

Gerard Ghibaudo, Jalal Jomaah, Leily Zafari, 2008 .

Compact SIW leaky wave antenna

Mahmoud Kamarei, Hussam Ayad, Jalal Jomaah, 2015, 2015 Third International Conference on Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE).

Thorough Investigation of Kink-Related Excess Noise in Deep Submicron SOI N-MOSFETs on Unibond Substrate

Sebastien Haendler, J. L. Pelloie, C. Raynaud, 1999 .

Bayesian Statistics of Wide-Band Radar Reflections for Oil Spill Detection on Rough Ocean Surface

Ghaleb Faour, Hussam Ayad, Jalal Jomaah, 2019, Journal of Marine Science and Engineering.

Sebastien Haendler, Jalal Jomaah, Christine Raynaud, 2000 .

Comparative low frequency noise analysis in various SOI devices: floating body, body-tied, DTMOS with and without current limiter

S. Haendler, J. L. Pelloie, Jalal Jomaah, 2000, 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125).

Impact of front oxide quality on transient effects and low-frequency noise in partially and fully depleted SOI N-MOSFETs

S. Haendler, J. L. Pelloie, C. Raynaud, 2002 .

ON THE 1/F NOISE IN FULLY DEPLETED SOI TRANSISTORS

S. Haendler, Jalal Jomaah, F. Dieudonne, 2001 .

Even-odd mode of a double-Lorentz metamaterial and its application to a tri-band branch-line coupler

Majida Fadlallah, Jalal Jomaah, Fabien Ndagijimana, 2016 .

Shrinking from 0.25 µm down to 0.12 µm SOI CMOS technology node: a contribution to 1/f noise in partially depleted n-MOSFETs

Christina De Meyer, C. Raynaud, Jalal Jomaah, 2002 .

Thorough characterization of deep-submicron surface and buried channel pMOSFETs

G. Guegan, Gerard Ghibaudo, B. Cretu, 2002 .

Low frequency noise and hot-carrier reliability in advanced SOI MOSFETs

S. Haendler, Jalal Jomaah, Francis Balestra, 2004 .

Explicit Threshold Voltage Based Compact Model of Independent Double Gate MOSFET

Jalal Jomaah, M. Reyboz, O Rozeau, 2006 .

Reliability of ultra-thin film deep submicron SIMOX nMOSFETs

S. Haendler, C. Raynaud, Jalal Jomaah, 2002 .

Experimental investigation and numerical simulation of low‐frequency noise in thin film SOI MOSFETs

Gerard Ghibaudo, Jalal Jomaah, Francis Balestra, 1994 .

Investigation of the reliability of Unibond and SIMOX N-MOSFETs using charge pumping and noise techniques

C. Raynaud, Jalal Jomaah, F. Balestra, 1998 .

Low Frequency Noise Analysis in Advanced CMOS Devices

Gerard Ghibaudo, Majida Fadlallah, Jalal Jomaah, 2011 .