Hyun-Gu Kang

发表

Damage profiling of Ar+ sputtered Si(100) surface by medium energy ion scattering spectroscopy

Hanchul Kim, D. Moon, Junsu Lee, 1996 .

Compositional changes in the surface layers of the Cu3Au(1 0 0) below the bulk transition temperature

K. Chae, B. King, D. J. O'connor, 2001 .

Ab initio study of ZnO- and GaN-based diluted magnetic semiconductors and its magnetic properties

W. Kim, Hyun-Gu Kang, B. Kang, 2006 .

Quantitative depth profiling of nitrogen in ultrathin oxynitride film with low energy SIMS

K. J. Kim, D. Moon, H. K. Kim, 2003 .

Oxygen enhanced secondary ion emission of Fe and Co by TOF-SIMS and ISS/DR

K. J. Kim, D. Moon, Hyun-Gu Kang, 1995 .

Atomic structure of Cs layer grown on Si(0 0 1)(2 × 1) surface at room temperature

Jaeyoung Park, J. Seo, K. Chae, 2003 .

Atomic structure of Cs grown on Si(001)(2×1) surface by coaxial impact collision ion scattering spectroscopy

Jaeyoung Park, J. Seo, K. Chae, 2003 .

Dynamic Monte Carlo simulation for SIMS depth profiling of delta-doped layer

R. Shimizu, D. Moon, Woo Sun Kim, 1999 .

Medium‐energy ion scattering spectroscopy for quantitative surface and near‐surface analysis of ultrathin films

Hanchul Kim, Yongsup Park, Ki-Bok Kim, 2000 .

Dynamic Monte Carlo simulation for cascade interfacial mixing

K. Chae, D. Moon, C. Whang, 1992 .

The incident angle effect on radiation damage and sputtering for low energy Ar+ ion bombardment

D. Moon, Hyun-Gu Kang, J. Kim, 1997 .

Temperature Dependence of Band Alignment in Ultra-thin HfO2/Si Interface

Sang Wan Lee, M. Cho, S. Oh, 2005 .

Quantitative surface analysis of FeNi alloy films by XPS, AES and SIMS

K. J. Kim, C. J. Park, G. Gillen, 2007 .

Ultrathin cobalt silicide film formation on Si(100)

Jaehoon Kim, H. J. Kang, S. Oh, 2003 .

Multiple As delta layered Si thin films for SIMS quantification and depth scale calibration

Hanchul Kim, K. Kim, D. Moon, 2003 .

Atomic Scale Interface Analysis with MEIS for Nano-Electronics Technology

K. J. Kim, Hanchul Kim, D. Moon, 2002 .