Kun-Hsien Lin

发表

Overview on electrostatic discharge protection designs for mixed-voltage I/O interfaces: design concept and circuit implementations

Ming-Dou Ker, Kun-Hsien Lin, 2006, IEEE Transactions on Circuits and Systems I: Regular Papers.

Decoding CMOS Rolling-Shutter Pattern in Translational or Rotational Motions for VLC

Chi-Wai Chow, Xin-Lan Liao, Yi-Yuan Chen, 2019, IEEE Photonics Journal.

ESD Protection Design for Mixed-Voltage I/O Interfaces -- Overview

Ming-Dou Ker, Kun-Hsien Lin, 2005, 2005 IEEE Conference on Electron Devices and Solid-State Circuits.

Design on latchup-free power-rail ESD clamp circuit in high-voltage CMOS ICs

Ming-Dou Ker, Kun-Hsien Lin, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

Secure Mobile-Phone Based Visible Light Communications With Different Noise-Ratio Light-Panel

Chien-Hung Yeh, Chi-Wai Chow, Yen-Chun Liu, 2018, IEEE Photonics Journal.

Visible Light Communication Using Advertisement-Light-Board and Rolling-Shutter-Effect based CMOS Mobile-Phone Camera

Liang-Yu Wei, Chin-Wei Hsu, Yung Hsu, 2018, 2018 23rd Opto-Electronics and Communications Conference (OECC).

Applications of Barcode Images by Enhancing the Two-Dimensional Recognition Rate

Kun-Hsien Lin, Jen-Yu Shieh, Jia-Long Zhang, 2012 .

Design on ESD protection scheme for IC with power-down-mode operation

Ming-Dou Ker, Kun-Hsien Lin, 2004 .

Electrostatic discharge protection scheme without leakage current path for CMOS IC operating in power-down-mode condition on a system board

Ming-Dou Ker, Kun-Hsien Lin, 2006, Microelectron. Reliab..

ESD protection design for IC with power-down-mode operation

Ming-Dou Ker, Kun-Hsien Lin, 2004, 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512).

The impact of low-holding-voltage issue in high-voltage CMOS technology and the design of latchup-free power-rail ESD clamp circuit for LCD driver ICs

Ming-Dou Ker, Kun-Hsien Lin, 2005 .

MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process

Ming-Dou Ker, Che-Hao Chuang, Kun-Hsien Lin, 2005, IEICE Trans. Electron..

Double snapback characteristics in high-voltage nMOSFETs and the impact to on-chip ESD protection design

Ming-Dou Ker, Kun-Hsien Lin, 2004 .