A. Kuzin

发表

Three-Dimensional Reconstruction of the Surfaces of Relief Structures from Stereoscopic Images Obtained in a Scanning Electron Microscope

V. P. Gavrilenko, M. N. Filippov, P. A. Todua, 2015 .

Thermal Action of an Electronic Probe with X-ray Spectral Nanoanalysis

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2017 .

Thermal Effects During Low-Voltage Electron-Probe X-Ray Spectral Microanalysis with Nanometer Localization

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2017 .

On-chip Photonic Crystal Cavity Integrated with Thermal Graphene Source

G. Goltsman, A. Kuzin, P. An, 2022, 2022 Photonics & Electromagnetics Research Symposium (PIERS).

Measurement of the Thickness Nonuniformity of Nanofilms Using an Electron Probe Method

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2016, Measurement Techniques.

An X-ray Fluorescence Determination of Platinum and Rhodium in Autocatalysts on a Ceramic Base

M. N. Filippov, Y. Karpov, T. Kupriyanova, 2013 .

The possibility of using the additions method for the x-ray fluorescence determination of platinum and rhodium in spent ceramic-based autocatalysts with the sample converted into a powder and the addition of liquids

M. N. Filippov, Udc, Y. Karpov, 2013 .

Natural oxide thickness measurements on the test silicon relief pitch structure

V. P. Gavrilenko, M. N. Filippov, A. V. Rakov, 2013, Other Conferences.

A study of the characteristics of the cantilevers of atomic-force microscopes

P. A. Todua, V. M. Lakhov, Y. Novikov, 2009 .

Measurement of the native oxide thickness on a reference relief pitch structure on a single-crystal silicon substrate

P. A. Todua, V. B. Mityukhlyaev, V. Gavrilenko, 2013 .

Measurement of the native oxide thickness on a reference relief pitch structure on a single-crystal silicon substrate

P. A. Todua, V. B. Mityukhlyaev, V. Gavrilenko, 2013, Russian microelectronics.

Experimental Study of Three-Dimensional Reconstruction of Relief Structures from Stereo Images Obtained in a Scanning Electron Microscope

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2016 .

Analysis of Factors Affecting the Accuracy of Three-Dimensional Reconstruction of the Surface of Objects with Submicrometer Relief Obtained by Scanning Electron Microscope Stereo Images

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2016 .

Development of Certified Reference Materials and Methods of Calibration of Small-Angle X-Ray Diffractometers for Certification and Standardization of Articles Produced by Nanoindustry

P. A. Todua, V. B. Mityukhlyaev, M. A. Ermakova, 2013 .

Development of Certified Reference Materials and Methods of Calibration of Small-Angle X-Ray Diffractometers for Certification and Standardization of Articles Produced by Nanoindustry

P. A. Todua, V. B. Mityukhlyaev, M. A. Ermakova, 2013, Measurement Techniques.

Electron Probe Measurements of Oxide Film Thickness on Silicon Surfaces

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2015 .

New stage in the metrological provision for sensors

A. Yu. Kuzin, Yu. V. Tarbeev, R. E. Taimanov, 2007 .

Functional Visualization of the Results of Predictive Modeling in the Tasks of Aerodynamics

József Tick, Alexey Zhuravlev, Alexey Kuzin, 2020 .

Compact Generator of an Optical Frequency Comb Based on Distributed-Feedback Laser Diode and High-Q Optical Microcavity

F. V. Bulygin, K. Min’kov, A. Kuzin, 2023, Journal of Experimental and Theoretical Physics.