D. Dance

APPLIED Co $ t MODELING Information Exchange For Your Application & Use Of Cost Modeling

Kelly, D. Dance, Wright Williams, 1999 .

Application of yield models for semiconductor yield improvement

R. Jarvis, D. L. Dance, D. Dance, 1992, Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.

Estimating semiconductor yield from equipment particle measurements

D. Dance, K. Gildersleeve, K. Gildersleeve, 1992, [1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium.

Using yield models to accelerate learning curve progress (semiconductor industry)

D. Dance, R. Jarvis, D. Dance, 1992 .