C.R. Cleavelin

发表

Yuan Taur, Bo Yu, Jooyoung Song, 2007, 2007 IEEE International SOI Conference.

G. Knoblinger, C. Pacha, M. Fulde, 2007, 2007 IEEE International SOI Conference.

G. Knoblinger, F. Kuttner, C.R. Cleavelin, 2005, 2005 IEEE International SOI Conference Proceedings.

C. Pacha, C.R. Cleavelin, P. Patruno, 2007, 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

C. Bassin, C.R. Cleavelin, P. Patruno, 2005, 2005 IEEE International SOI Conference Proceedings.

C.R. Cleavelin, P. Patruno, T. Schulz, 2006, IEEE Electron Device Letters.

C.R. Cleavelin, P. Patruno, T. Schulz, 2005, 2005 IEEE International SOI Conference Proceedings.

G. Knoblinger, C.R. Cleavelin, P. Patruno, 2006, IEEE Electron Device Letters.

Tsu-Jae King, C.R. Cleavelin, P. Patruno, 2004, 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573).

A. Marshall, C. Duvvury, C.R. Cleavelin, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

C.R. Cleavelin, D. Onsongo, S. Dey, 2004, IEEE Transactions on Electron Devices.

C.R. Cleavelin, P. Patruno, T. Schulz, 2006, IEEE Electron Device Letters.

C.R. Cleavelin, J.-P. Colinge, J. Colinge, 2006, IEEE Transactions on Electron Devices.

C. Mazure, C.R. Cleavelin, P. Patruno, 2006, IEEE Electron Device Letters.

G. Knoblinger, C.R. Cleavelin, P. Patruno, 2006, IEEE Transactions on Nuclear Science.

G. Knoblinger, C.R. Cleavelin, P. Patruno, 2006, IEEE Electron Device Letters.

C.R. Cleavelin, T. Schulz, K. Matthews, 2004, IEEE Electron Device Letters.