Chin-Chi Teng

Hierarchical electromigration reliability diagnosis for VLSI interconnects

Sung-Mo Kang, Elyse Rosenbaum, Chin-Chi Teng, 1996, DAC '96.

Statistical Estimation Of Average Power Dissipation In Sequential Circuits

Sung-Mo Kang, Chin-Chi Teng, Li-Pen Yuan, 1997, Proceedings of the 34th Design Automation Conference.

Statistical estimation of average power dissipation in CMOS VLSI circuits using nonparametric techniques

Sung-Mo Kang, Chin-Chi Teng, Li-Pen Yuan, 1996, Proceedings of 1996 International Symposium on Low Power Electronics and Design.

High-level hot carrier reliability-driven synthesis using macro-models

Sung-Mo Kang, Chin-Chi Teng, T. Karnik, 1995, Proceedings of the IEEE 1995 Custom Integrated Circuits Conference.

Learning for Reducing the Configuration eedforward Neural Network

Benjamin W. Wah, Chin-Chi Teng, B. Wah, 1996 .

iTEM: a temperature-dependent electromigration reliability diagnosis tool

Sung-Mo Kang, Elyse Rosenbaum, Chin-Chi Teng, 1997, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Automated learning for reducing the configuration of a feedforward neural network

Benjamin W. Wah, Chin-Chi Teng, B. Wah, 1996, IEEE Trans. Neural Networks.

ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips

Sung-Mo Kang, Elyse Rosenbaum, Chin-Chi Teng, 1998, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..