Yi-Kan Cheng

Hierarchical electromigration reliability diagnosis for VLSI interconnects

Sung-Mo Kang, Elyse Rosenbaum, Chin-Chi Teng, 1996, DAC '96.

A New Flexible Algorithm for Random Yield Improvement

S. Sinha, Yi-Kan Cheng, C. Chiang, 2008, IEEE Transactions on Semiconductor Manufacturing.

A temperature-aware simulation environment for reliable ULSI chipdesign

Sung-Mo Kang, Yi-Kan Cheng, S. Kang, 2000, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

iTEM: a temperature-dependent electromigration reliability diagnosis tool

Sung-Mo Kang, Elyse Rosenbaum, Chin-Chi Teng, 1997, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Configurable analog routing methodology via technology and design constraint unification

Hung-Ming Chen, Po-Cheng Pan, Wei-Yi Hu, 2012, 2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).

Temperature-driven power and timing analysis for CMOS ULSI circuits

Sung-Mo Kang, Yi-Kan Cheng, S. Kang, 1999, ISCAS'99. Proceedings of the 1999 IEEE International Symposium on Circuits and Systems VLSI (Cat. No.99CH36349).

ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips

Sung-Mo Kang, Elyse Rosenbaum, Chin-Chi Teng, 1998, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Electrothermal Simulation and Temperature-Sensitive Reliability Diagnosis for CMOS VLSI Circuits

Yi-Kan Cheng, Yi-Kan Cheng, 1997 .