M. R. Mercer
发表
E. Schell,
M. R. Mercer,
1985,
DAC 1985.
E. S. Park,
M. R. Mercer,
T. W. Williams,
1988
.
M. R. Mercer,
T. W. Williams,
J. P. Mucha,
2001,
Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179).
Miroslaw Malek,
M. R. Mercer,
1991
.
M. R. Mercer,
R. Kapur,
D. E. Ross,
1991,
Proceedings of the European Conference on Design Automation..
E. S. Park,
M. R. Mercer,
T. W. Williams,
1992,
IEEE Trans. Computers.
M. R. Mercer,
C. Oh,
1995,
Proceedings of Eighth International Application Specific Integrated Circuits Conference.
M. Ray Mercer,
Rohit Kapur,
Thomas W. Williams,
1996,
Proceedings International Test Conference 1996. Test and Design Validity.
J. H. Aylor,
M. R. Mercer,
G. Swaminathan,
1993,
Proceedings ETC 93 Third European Test Conference.
M. Ray Mercer,
Kenneth M. Butler,
M. R. Mercer,
1992
.
M. R. Mercer,
Jennifer Dworak,
David Dorsey,
2003
.
M. Ray Mercer,
Weiping Shi,
Michael R. Grimaila,
2005,
IEEE International Conference on Test, 2005..
M. Ray Mercer,
Weiping Shi,
Michael R. Grimaila,
2003,
2003 Test Symposium.
M. Ray Mercer,
Vishwani D. Agrawal,
M. R. Mercer,
1982,
ITC.
Don E. Ross,
M. Ray Mercer,
Kenneth M. Butler,
1991,
J. Electron. Test..
M. Ray Mercer,
Michael R. Grimaila,
Jennifer Dworak,
2000,
Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).
M. Ray Mercer,
Kenneth M. Butler,
Jaehong Park,
1999,
Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).
M. Ray Mercer,
Thomas W. Williams,
Li-C. Wang,
1996,
Proceedings International Conference on Computer Design. VLSI in Computers and Processors.
M. Ray Mercer,
Thomas W. Williams,
Li-C. Wang,
1995,
Proceedings of 1995 IEEE International Test Conference (ITC).
M. Ray Mercer,
Thomas W. Williams,
Li-C. Wang,
1995,
Proceedings 13th IEEE VLSI Test Symposium.
M. Ray Mercer,
Rohit Kapur,
Thomas W. Williams,
1994,
Proceedings of IEEE VLSI Test Symposium.
M. Ray Mercer,
Rohit Kapur,
Jaehong Park,
1992,
Proceedings International Test Conference 1992.
M. Ray Mercer,
Kenneth M. Butler,
Michael R. Grimaila,
2001,
IEEE Des. Test Comput..
M. Ray Mercer,
Vishwani D. Agrawal,
M. R. Mercer,
1986,
International Test Conference.
M. Ray Mercer,
Tom E. Kirkland,
M. R. Mercer,
1987,
24th ACM/IEEE Design Automation Conference.
M. Ray Mercer,
Kenneth M. Butler,
M. R. Mercer,
1992
.
M. R. Mercer,
Weiping Shi,
Yuxin Tian,
2005,
SPIE Photomask Technology.
M. R. Mercer,
T.W. Williams,
M.R. Mercer,
1989,
IEEE Design & Test of Computers.
M. Ray Mercer,
Thomas W. Williams,
Eun Sei Park,
1988,
International Test Conference 1988 Proceeding@m_New Frontiers in Testing.
M. R. Mercer,
R. Dennard,
R. Kapur,
1996,
ED&TC.
M. Ray Mercer,
Rohit Kapur,
Thomas W. Williams,
1996,
Proceedings ED&TC European Design and Test Conference.
M. Ray Mercer,
Thomas W. Williams,
Bill Underwood,
1991,
28th ACM/IEEE Design Automation Conference.
M. Ray Mercer,
Michael R. Grimaila,
Jennifer Dworak,
2002,
Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.
M. Ray Mercer,
M. R. Mercer,
1986,
International Test Conference.