M. R. Mercer

发表

CADTOOLS: A CAD Algorithm Development System

E. Schell, M. R. Mercer, 1985, DAC 1985.

and Defect Level for Delay Fa&s Statistical Delay Fault Coverage

E. S. Park, M. R. Mercer, T. W. Williams, 1988 .

Code coverage, what does it mean in terms of quality?

M. R. Mercer, T. W. Williams, J. P. Mucha, 2001, Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179).

Testing and Fault-Tolerant Design Techniques for Advanced Digital Architectures

Miroslaw Malek, M. R. Mercer, 1991 .

Fast functional evaluation of candidate OBDD variable orderings

M. R. Mercer, R. Kapur, D. E. Ross, 1991, Proceedings of the European Conference on Design Automation..

The Total Delay Fault Model and Statistical Delay Fault Coverage

E. S. Park, M. R. Mercer, T. W. Williams, 1992, IEEE Trans. Computers.

Efficient timing analysis using constraint-guided critical path search

M. R. Mercer, C. Oh, 1995, Proceedings of Eighth International Application Specific Integrated Circuits Conference.

Iddq test: sensitivity analysis of scaling

M. Ray Mercer, Rohit Kapur, Thomas W. Williams, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

Algebraic ATPG of combinational circuits using binary decision diagrams

J. H. Aylor, M. R. Mercer, G. Swaminathan, 1993, Proceedings ETC 93 Third European Test Conference.

Test Performance Evaluation

M. Ray Mercer, Kenneth M. Butler, M. R. Mercer, 1992 .

Estimating Mean Time to Failure in Digital Systems Using Manufacturing Defective Part Level

M. R. Mercer, Jennifer Dworak, David Dorsey, 2003 .

An optimal test pattern selection method to improve the defect coverage

M. Ray Mercer, Weiping Shi, Michael R. Grimaila, 2005, IEEE International Conference on Test, 2005..

Minimizing defective part level using a linear programming-based optimal test selection method

M. Ray Mercer, Weiping Shi, Michael R. Grimaila, 2003, 2003 Test Symposium.

Testability Measures : What Do They Tell Us ?

M. Ray Mercer, Vishwani D. Agrawal, M. R. Mercer, 1982, ITC.

Exact ordered binary decision diagram size when representing classes of symmetric functions

Don E. Ross, M. Ray Mercer, Kenneth M. Butler, 1991, J. Electron. Test..

Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D

M. Ray Mercer, Michael R. Grimaila, Jennifer Dworak, 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).

REDO-random excitation and deterministic observation-first commercial experiment

M. Ray Mercer, Kenneth M. Butler, Jaehong Park, 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

A better ATPG algorithm and its design principles

M. Ray Mercer, Thomas W. Williams, Li-C. Wang, 1996, Proceedings International Conference on Computer Design. VLSI in Computers and Processors.

On efficiently and reliably achieving low defective part levels

M. Ray Mercer, Thomas W. Williams, Li-C. Wang, 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

On the decline of testing efficiency as fault coverage approaches 100%

M. Ray Mercer, Thomas W. Williams, Li-C. Wang, 1995, Proceedings 13th IEEE VLSI Test Symposium.

Limitations in predicting defect level based on stuck-at fault coverage

M. Ray Mercer, Rohit Kapur, Thomas W. Williams, 1994, Proceedings of IEEE VLSI Test Symposium.

All Tests for a Fault are Not Eyually Valuable for Defect Detection

M. Ray Mercer, Rohit Kapur, Jaehong Park, 1992, Proceedings International Test Conference 1992.

Defect-Oriented Testing and Defective-Part-Level Prediction

M. Ray Mercer, Kenneth M. Butler, Michael R. Grimaila, 2001, IEEE Des. Test Comput..

Deterministic Versus Random Testing

M. Ray Mercer, Vishwani D. Agrawal, M. R. Mercer, 1986, International Test Conference.

A Topological Search Algorithm for ATPG

M. Ray Mercer, Tom E. Kirkland, M. R. Mercer, 1987, 24th ACM/IEEE Design Automation Conference.

Suggestions for Future Research

M. Ray Mercer, Kenneth M. Butler, M. R. Mercer, 1992 .

Impact of photolithography and mask variability on interconnect parasitics

M. R. Mercer, Weiping Shi, Yuxin Tian, 2005, SPIE Photomask Technology.

A statistical model for delay-fault testing

M. R. Mercer, T.W. Williams, M.R. Mercer, 1989, IEEE Design & Test of Computers.

Statistical delay fault coverage and defect level for delay faults

M. Ray Mercer, Thomas W. Williams, Eun Sei Park, 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

Iddq Testing for High Performance CMOS - The Next Ten Years

M. R. Mercer, R. Dennard, R. Kapur, 1996, ED&TC.

Iddq testing for high performance CMOS-the next ten years

M. Ray Mercer, Rohit Kapur, Thomas W. Williams, 1996, Proceedings ED&TC European Design and Test Conference.

The interdependence between delay-optimization of synthesized networks and testing

M. Ray Mercer, Thomas W. Williams, Bill Underwood, 1991, 28th ACM/IEEE Design Automation Conference.

A new ATPG algorithm to limit test set size and achieve multiple detections of all faults

M. Ray Mercer, Michael R. Grimaila, Jennifer Dworak, 2002, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.

Logic Elements for Universally Testable Circuits

M. Ray Mercer, M. R. Mercer, 1986, International Test Conference.