David T. Schaafsma
发表
James H. Bechtel,
David T. Schaafsma,
Gail Palmer,
2003,
SPIE BiOS.
David T. Schaafsma,
H. Warren Shen,
Richard D. Finlayson,
2001,
SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring.
Ishwar D. Aggarwal,
Giorgio Margaritondo,
Norman H. Tolk,
1998
.