P. Fine

Large area, low capacitance Si(Li) detectors for high rate X-ray applications

N. Madden, C. Rossington, P. Fine, 1993 .

Determination Of Surface Recombination Velocity And Bulk Lifetime In Detector Grade Silicon And Germanium Crystals

P. Luke, C. Rossington, J. Walton, 1993, 1993 IEEE Conference Record Nuclear Science Symposium and Medical Imaging Conference.

Lawrence Berkeley National Laboratory Recent Work Title Determination of Surface Recombination Velocity and Bulk Lifetime in Detector Grade Silicon and Germanium Crystals Permalink

P. Luke, C. Rossington, Yiu K Wong, 2007 .

Underfill of flip chip on laminates: simulation and validation

H. Yang, P. Fine, S.A. Bidstrup-Allen, 1998, Proceedings of 3rd International Conference on Adhesive Joining and Coating Technology in Electronics Manufacturing 1998 (Cat. No.98EX180).

High performance underfills development - materials, processes, and reliability

C. Wong, L. Hoang, L. Nguyen, 1997, Proceedings. The First IEEE International Symposium on Polymeric Electronics Packaging, PEP '97 (Cat. No.97TH8268).

Flip chip underfill flow characteristics and prediction

P. Fine, L. Nguyen, B. Cobb, 1999, 1999 Proceedings. 49th Electronic Components and Technology Conference (Cat. No.99CH36299).