Loren W. Linholm
发表
P. Bendix,
M. W. Cresswell,
N. Arora,
2001,
ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153).
E. M. Vogel,
M. W. Cresswell,
R. A. Allen,
1999,
ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307).
Richard A. Allen,
Mona E. Zaghloul,
Michael W. Cresswell,
2002,
SPIE Photomask Technology.
M. W. Cresswell,
R. A. Allen,
Loren W. Linholm,
1998,
ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).
M. W. Cresswell,
R. A. Allen,
Loren W. Linholm,
2000,
ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).
M. W. Cresswell,
R. A. Allen,
Loren W. Linholm,
2000,
ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).
Richard A. Allen,
Loren W. Linholm,
Lynda C. Hannemann-Mantalas,
1991,
Other Conferences.
M. W. Cresswell,
R. A. Allen,
Loren W. Linholm,
1990,
Proceedings of the 1991 International Conference on Microelectronic Test Structures.
M. W. Cresswell,
R. A. Allen,
Loren W. Linholm,
1992,
ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures.
Electrical linewidth test structures patterned in [100] silicon-on-insulator for use as CD standards
Richard A. Allen,
John E. Bonevich,
Michael W. Cresswell,
2001
.
E. C. Teague,
John A. Kramar,
M. W. Cresswell,
1995,
Proceedings International Conference on Microelectronic Test Structures.
M. W. Cresswell,
R. A. Allen,
Loren W. Linholm,
1998,
ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).
M. W. Cresswell,
Loren W. Linholm,
D. Khera,
1992
.
Loren W. Linholm,
Richard F. Plachy,
1973
.
Richard A. Allen,
Ronald G. Dixson,
Michael W. Cresswell,
1996
.
Richard A. Allen,
Michael W. Cresswell,
Loren W. Linholm,
1996
.
Jeffry J. Sniegowski,
M. W. Cresswell,
R. A. Allen,
1998
.
Michael T. Postek,
Robert D. Larrabee,
Loren W. Linholm,
1991
.
M. W. Cresswell,
R. A. Allen,
Loren W. Linholm,
2001
.
M. W. Cresswell,
R. A. Allen,
Loren W. Linholm,
1997
.
Jeffry J. Sniegowski,
M. W. Cresswell,
R. A. Allen,
1997,
1997 IEEE International Conference on Microelectronic Test Structures Proceedings.