Ken Sawada

In-line monitoring test structure for Charge-Based Capacitance Measurement (CBCM) with a start-stop self-pulsing circuit

Abdelkarim Mercha, Ken Sawada, Geert Van der Plas, 2015, Proceedings of the 2015 International Conference on Microelectronic Test Structures.

Pitfalls when using the SEED methodology

Mirko Scholz, Dimitri Linten, Steven Thijs, 2012 .

A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS

Diederik Verkest, Aaron Thean, Piet Wambacq, 2015, 2015 IEEE Asian Solid-State Circuits Conference (A-SSCC).

Highly effective and versatile test structure for evaluating dielectric properties using flexible pulse generator on chip

Hidetoshi Ohnuma, Tsuyoshi Suzuki, Ken Sawada, 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS).

(Invited) First-Principles Studies of the Defect Formation in III-V FETs Grown by Fin Replacement Method

Eddy Simoen, Niamh Waldron, Geoffrey Pourtois, 2014 .