D. A. Gleason

Local trap spectroscopy on cross-sectioned AlGaN/GaN devices with in situ biasing

S. Ringel, A. Arehart, E. Heller, 2019, Applied Physics Letters.

Correlative Defect Characterization in Semiconductors via Electron Channeling Contrast Imaging and Scanning Deep Level Transient Spectroscopy

S. Ringel, T. Grassman, A. Arehart, 2018, Microscopy and Microanalysis.

Spatial correlation of the EC-0.57 eV trap state with edge dislocations in epitaxial n-type gallium nitride

S. Ringel, J. Speck, T. Grassman, 2018, Journal of Applied Physics.