M. Piazza
发表
J. Bluet,
V. Hoel,
N. Malbert,
2010,
2010 IEEE International Reliability Physics Symposium.
J. Bluet,
V. Hoel,
N. Malbert,
2010,
The 5th European Microwave Integrated Circuits Conference.
Christian Dua,
Mourad Oualli,
Dominique Carisetti,
2009,
Microelectron. Reliab..