N. Shimura

Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEM.

H. Sawada, Y. Ikuhara, N. Shibata, 2015, Microscopy.

Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F

H. Sawada, E. Okunishi, Y. Kohno, 2014 .