T. Martin

A comparison of growth hillock structure and step dynamics on KDP {100} and {101} surfaces using force microscopy

J. D. Yoreo, G. Palmore, T. A. Land, 1999 .

AFM investigation of step kinetics and hillock morphology of the {1 0 0} face of KDP

T. N. Thomas, W. Casey, T. Land, 2004 .

Modelling of high temperature optical constants and surface roughness evolution during MOVPE growth of GaN using in-situ spectral reflectometry

C. Pickering, A. J. Pidduck, C. Pickering, 2002 .