D. Panko

Time-to-Fail Extraction Model for the "Mixed-Mode" Reliability of High-Performance SiGe Bipolar Transistors

T. Vanhoucke, G. Hurkx, D. Panko, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

Lycoperdonosis: Report of two cases and discussion of the disease

E. Munson, D. Panko, J. Fink, 1997 .