E. Wu

Min-log approach to modeling dielectric breakdown data

Baozhen Li, E. Yashchin, J. Stathis, 2012, 2012 IEEE International Reliability Physics Symposium (IRPS).

Fundamental limitations of existing models and future solutions for dielectric reliability and RRAM applications (invited)

B. Li, J. Stathis, E. Wu, 2017, 2017 IEEE International Electron Devices Meeting (IEDM).

Failure-current based oxide reliability assessment methodology

E. Wu, J. Sune, S. Tous, 2008, 2008 IEEE International Reliability Physics Symposium.

A time-dependent clustering model for non-uniform dielectric breakdown

B. Li, E. Wu, R. Filippi, 2013, 2013 IEEE International Electron Devices Meeting.