K. Spark

Creep of thin film Au on bimaterial Au/Si microcantilevers

K. Gall, M. Dunn, D. Finch, 2004 .

Thermomechanical behavior and reliability of Au/Si MEMS structures

K. Gall, C. Herrmann, S. George, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.

Shape Memory at Nanometer Scales

K. Gall, T. Lang, C. Frick, 2005 .

Stress-induced martensitic transformations and shape memory at nanometer scales

Ken Gall, Kevin Spark, K. Gall, 2006 .

Atomistic modeling of nanowires, small-scale fatigue damage in cast magnesium, and materials for MEMS

David C. Miller, D. McDowell, J. Zimmerman, 2006 .

Creep and stress relaxation in bilayer Au/Si microcantilevers

Ken Gall, Neil West, Kevin Spark, 2004, SPIE MOEMS-MEMS.