K. Baker

An advanced flash memory technology on SOI

D. Burnett, D. Shum, K. Baker, 1998, International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).

Soft error rate and stored charge requirements in advanced high-density SRAMs

C. Lage, D. Burnett, T. McNelly, 1993, Proceedings of IEEE International Electron Devices Meeting.

Embedded split-gate flash memory with silicon nanocrystals for 90nm and beyond

Ko-Min Chang, H. Gasquet, Sung-Taeg Kang, 2008, 2008 Symposium on VLSI Technology.