Peter D. Rhyins
发表
Christopher J. Progler,
Ernest Wayne Balch,
Peter D. Rhyins,
2003,
SPIE MOEMS-MEMS.
Peter D. Rhyins,
M. Fritze,
Brian Tyrrell,
2002,
SPIE Advanced Lithography.
Toshihiro Oga,
Takeaki Ebihara,
Peter D. Rhyins,
2002,
SPIE Photomask Technology.
Investigation of full-field CD control of sub-100-nm gate features by phase-shift 248-nm lithography
Martin E. Mastovich,
David K. Astolfi,
Neal T. Sullivan,
2001,
SPIE Advanced Lithography.
David K. Astolfi,
Peter D. Rhyins,
M. Fritze,
2002
.
David K. Astolfi,
Paul Davis,
Peter D. Rhyins,
2001,
SPIE Advanced Lithography.
Christopher J. Progler,
Peter D. Rhyins,
Susan G. Cann,
2002,
SPIE Advanced Lithography.
Ecron Thompson,
Peter D. Rhyins,
Patrick M. Martin,
2003,
SPIE Advanced Lithography.
Chris A. Mack,
Peter D. Rhyins,
M. Fritze,
2002,
SPIE Photomask Technology.
Peter D. Rhyins,
M. Fritze,
Brian Tyrrell,
2003,
SPIE Advanced Lithography.
Peter D. Rhyins,
M. Fritze,
Susan G. Cann,
2001
.
Peter D. Rhyins,
M. Fritze,
Brian Tyrrell,
2002
.