E.J. McCluskey

Diagnosing CMOS bridging faults with stuck-at fault dictionaries

S.D. Millman, E.J. McCluskey, J.M. Acken, 1990, Proceedings. International Test Conference 1990.

Logic design education at Stanford University

E.J. McCluskey, J.F. Wakerly, 1988, [1988] Proceedings of the Twenty-First Annual Hawaii International Conference on System Sciences. Volume I: Architecture Track.

A self-test and self-diagnosis architecture for boards using boundary scans

E.J. McCluskey, L.-T. Wang, M. Marhoefer, 1989, [1989] Proceedings of the 1st European Test Conference.

Concurrent error detection and testing for large PLA's

E.J. McCluskey, J. Khakbaz, 1982, IEEE Transactions on Electron Devices.

Open faults in BiCMOS gates

E.J. McCluskey, S.C. Ma, 1994, Proceedings of IEEE VLSI Test Symposium.