Christoforos Theodorou

Hot carrier degradation modeling of short-channel n-FinFETs

Ioannis Messaris, Gérard Ghibaudo, C. A. Dimitriadis, 2015, 2015 73rd Annual Device Research Conference (DRC).

A new linear voltage-to-current converter with threshold voltage compensation for analog circuits applications in polycrystalline silicon TFT process

Stilianos Siskos, C. A. Dimitriadis, Christoforos Theodorou, 2009, 2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009).

Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs

Sébastien Haendler, Gérard Ghibaudo, Nicolas Planes, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Static and Low Frequency Noise Characterization of InGaAs MOSFETs and FinFETs on Insulator

Gérard Ghibaudo, T. A. Karatsori, Christoforos Theodorou, 2018, 2018 48th European Solid-State Device Research Conference (ESSDERC).

Noise-induced dynamic variability in nano-scale CMOS SRAM cells

Gérard Ghibaudo, C. A. Dimitriadis, Christoforos Theodorou, 2016, 2016 46th European Solid-State Device Research Conference (ESSDERC).

New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs

Sébastien Haendler, Gérard Ghibaudo, Nicolas Planes, 2015, 2015 IEEE International Reliability Physics Symposium.

Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs

Sylvain Barraud, Gérard Ghibaudo, C. A. Dimitriadis, 2016, 2016 46th European Solid-State Device Research Conference (ESSDERC).

Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs

Sébastien Haendler, Franck Arnaud, Gérard Ghibaudo, 2012, 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

Inter-tier Coupling Analysis in Back-illuminated Monolithic 3DSI Image Sensor Pixels

Gilles Sicard, Arnaud Peizerat, Perrine Batude, 2021, 2021 10th International Conference on Modern Circuits and Systems Technologies (MOCAST).

VERILOR: A Verilog-A Model of Lorentzian Spectra for Simulating Trap-related Noise in CMOS Circuits

Gérard Ghibaudo, Christoforos Theodorou, Angeliki Tataridou, 2021, ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC).