M. P. Brassington

Direct measurement of hot-carrier stress effects on CMOS circuit performance

S. C. Hu, M. P. Brassington, 1989 .

Semi-custom ASIC technology trends

M. P. Brassington, 1995, Proceedings of the IEEE 1995 Custom Integrated Circuits Conference.

An advanced single-level polysilicon submicrometer BiCMOS technology

M. P. Brassington, M. H. El-Diwany, R. R. Razouk, 1989 .

A new test structure for direct measurement of hot-carrier stress effects on CMOS circuit performance

M. P. Brassington, S. C. Hu, 1991 .