J.L. Cai

Use of Nanoprobing as the Diagnostic Tool for Nanoscaled Devices

Q.F. Wang, P. K. Tan, H. Tan, 2007, 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

In-Depth Electrical Analysis to Reveal the Failure Mechanisms With Nanoprobing

Q.F. Wang, P. K. Tan, H. Tan, 2008, IEEE Transactions on Device and Materials Reliability.