A. E. Gordon

Mechanisms of surface anodization produced by scanning probe microscopes

A. E. Gordon, R. Fayfield, D. Litfin, 1995 .

Atomic Force Microscope-Based Lithography of Titanium

M. Hagedorn, A. E. Gordon, R. Fayfield, 1995 .

Steps and spikes in current‐voltage characteristics of oxide/microcrystallite‐silicon/oxide diodes

S. Chou, A. E. Gordon, 1992 .

Silicon metal‐oxide‐semiconductor field‐effect transistor with gate structures defined by scanned probe lithography

M. Hagedorn, A. E. Gordon, D. Litfin, 1996 .