S.M. Menon

Estimation of partition size for I/sub DDQ/ testing using built-in current sensing

S.M. Menon, M. Palmgren, S. Menon, 1997, Digest of Papers IEEE International Workshop on IDDQ Testing.

A fast, predictable FPGA with PLLs, dual port SRAMs and active repeaters

S.M. Menon, W.E. Cory, P.T. Sasaki, 1999, Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat. No.99CH36327).