R. Martin
发表
R.A. Martin,
S.A. Buhler,
G. Lao,
1984,
1984 International Electron Devices Meeting.
M. Koyanagi,
R.A. Martin,
M. Koyanagi,
1987,
IEEE Electron Device Letters.
M. Koyanagi,
R.A. Martin,
M. Koyanagi,
1987,
IEEE Transactions on Electron Devices.
Investigation and reduction of hot electron induced punchthrough (HEIP) effect in submicron PMOSFETs
M. Koyanagi,
R.A. Martin,
M. Koyanagi,
1986,
1986 International Electron Devices Meeting.
M. Koyanagi,
R.A. Martin,
M. Koyanagi,
1986,
International Electron Devices Meeting.