Chaitanya Pasupuleti

A Cycle-by-Cycle HCD and BTI Compact Model to Calculate FinFET Based RO Ageing Using SPICE

S. Mahapatra, Uma Sharma, A. Thirunavukkarasu, 2020, 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).

BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array – including Sense Amplifiers and Write Drivers – under Processor Activity

Jörg Henkel, Victor M. van Santen, Hussam Amrouch, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).