T. Smedes
发表
T. Meuse,
R. Ashton,
J. Barth,
2012,
Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.
T. Smedes,
P.G.A. Emonts,
1998,
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).
T. Smedes,
D. Abessolo-Bidzo,
A. J. Huitsing,
2012,
IEEE Transactions on Electron Devices.
N. Peachey,
R. Ashton,
J. Barth,
2012,
Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.
R.M.D.A. Velghe,
T. Smedes,
R.S. Ruth,
2001,
2001 Electrical Overstress/Electrostatic Discharge Symposium.
T. Smedes,
2012,
Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.
N. P. van der Meijs,
T. Smedes,
1996,
ICCAD 1996.
T. Smedes,
A. van den Berg,
J. van Zwol,
2002,
2002 Electrical Overstress/Electrostatic Discharge Symposium.
T. Smedes,
T. Keller,
D. Maksimovic,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
T. Smedes,
Z. Mrcarica,
G. Notermans,
2006,
2006 Electrical Overstress/Electrostatic Discharge Symposium.
T. Smedes,
A. Heringa,
F. Blanc,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
T. Smedes,
P. Ngan,
R. Gramacy,
2001,
2001 Electrical Overstress/Electrostatic Discharge Symposium.
T. Smedes,
T. Brodbeck,
H. Wolf,
2006,
2006 Electrical Overstress/Electrostatic Discharge Symposium.
A.J. Annema,
T. Smedes,
J. Knol,
1999,
29th European Solid-State Device Research Conference.
T. Smedes,
Y. Christoforou,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
R. Ashton,
A. Righter,
T. Smedes,
2016,
2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
T. Smedes,
A.J. Huitsing,
P.C. de Jong,
2009,
2009 31st EOS/ESD Symposium.
T. Smedes,
M. H. Song,
J. C. Tseng,
2011,
EOS/ESD Symposium Proceedings.
T. Smedes,
Y. Christoforou,
S. Zhao,
2014,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014.
T. Smedes,
N. Guitard,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
T. Smedes,
A.J. Huitsing,
H.-U. Schroder,
2003,
ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705).
Effects of the lightly doped drain configuration on capacitance characteristics of submicron MOSFETs
T. Smedes,
F. M. Klaassen,
1990,
International Technical Digest on Electron Devices.
T. Smedes,
A. Heringa,
P.C. de Jong,
2002,
2002 Electrical Overstress/Electrostatic Discharge Symposium.
T. Smedes,
1995
.
T. Smedes,
1989,
ESSDERC '89: 19th European Solid State Device Research Conference.
T. Smedes,
Y. Li,
T. Smedes,
2003,
2003 Electrical Overstress/Electrostatic Discharge Symposium.
T. Smedes,
R. Stephan,
Z. Mrcarica,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.