Li Yu

Methodology for analysis of TSV stress induced transistor variation and circuit performance

Li Yu, Duane S. Boning, Douglas Yu, 2012, Thirteenth International Symposium on Quality Electronic Design (ISQED).

Compact Model Parameter Extraction Using Bayesian Inference, Incomplete New Measurements, and Optimal Bias Selection

Li Yu, Duane S. Boning, Ibrahim M. Elfadel, 2016, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Statistical library characterization using belief propagation across multiple technology nodes

Li Yu, Duane S. Boning, Ibrahim M. Elfadel, 2015, 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Efficient performance estimation with very small sample size via physical subspace projection and maximum a posteriori estimation

Li Yu, Duane S. Boning, Ibrahim M. Elfadel, 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Statistical modeling with the Virtual Source MOSFET model

Li Yu, Lan Wei, Duane S. Boning, 2013, 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE).