O. Hellman

发表

New SiGe dielectrics grown at room temperature by low‐energy ion beam oxidation and nitridation

N. Herbots, O. Vancauwenberghe, O. Hellman, 1991 .

Comparative study of low energy ion beam oxidation of Si(100), Ge/Si(100) and Si1−xGex/Si(100)

W. Croft, O. Vancauwenberghe, O. Hellman, 1992 .

Measurement of the Gibbsian interfacial excess of solute at an interface of arbitrary geometry using three-dimensional atom probe microscopy

D. Seidman, O. Hellman, 2002 .

Nano-structure Ge formed in thin film SiO2 using ion implantation

A. Yamada, P. Fons, S. Niki, 1993 .

New method for the calibration of three-dimensional atom-probe mass spectra

D. Seidman, J. Sebastian, O. Hellman, 2001 .

Heteroepitaxy and characterization of CuInSe2 on GaAs(001)

P. Fons, S. Niki, S. Chichibu, 1995 .

Topics in solid phase epitaxy: Strain, structure and geometry

O. Hellman, 1996 .

Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram

Dieter Isheim, David N. Seidman, J. Vandenbroucke, 2000, Microscopy and Microanalysis.

Kinetics of ion beam nitridation (IBN) of Si and of MBE-grown Ge and SixGe1−x alloys: The role of ion energy, ion dose and substrate temperature

O. Vancauwenberghe, O. C. Hellman, N. Herbots, 1992 .

Growth and characterization of CuInSe2 epitaxial films for device applications

P. Fons, S. Niki, O. Hellman, 1996 .

Atom-by-atom chemistry of internal interfaces: simulations and experiments

D. Seidman, J. Sebastian, O. Hellman, 2001 .

Dependence of interfacial excess on the threshold value of the isoconcentration surface

D. Seidman, R. Noebe, O. Hellman, 2004 .

Three-dimensional Investigation of Ceramic/Metal Heterophase Interfaces by Atom-probe Microscopy

D. Seidman, J. Sebastian, O. Hellman, 2000, Microscopy and Microanalysis.

Efficient sampling for three-dimensional atom probe microscopy data.

Olof C Hellman, John Blatz du Rivage, David N Seidman, 2003, Ultramicroscopy.

Application software for data analysis for three-dimensional atom probe microscopy

David N. Seidman, J. Vandenbroucke, D. Seidman, 2002 .

Atomic-scale Study of a Transition Phase Precipitate and Its Interfacial Chemistry in an Fe−15 at.% Mo−5 at.% V Alloy

D. Seidman, D. Isheim, D. Blavette, 2001, Microscopy and Microanalysis.

Atomic-Scale Structure and Chemistry of Segregation at Matrix/Precipitate Heterophase Interfaces

D. Seidman, D. Isheim, O. Hellman, 2001 .

ATOMIC-SCALE STUDY OF SECOND-PHASE FORMATION INVOLVING LARGE COHERENCY STRAINS IN Fe-20 at.% Mo

D. Seidman, D. Isheim, D. Blavette, 2000 .

A subnanoscale study of segregation at CdO/Ag(Au) heterophase interfaces

D. Seidman, J. Sebastian, O. Hellman, 2000 .

Identification of 2D Boundaries from 3D Atom Probe Data, and Spatial Correlation of Atomic Distributions with Interfaces

Dieter Isheim, David N. Seidman, J. Vandenbroucke, 1999 .

Role of ion energy in ion beam oxidation of semiconductors: Experimental study and model

N. Herbots, O. Vancauwenberghe, O. Hellman, 1992 .

A quantitative model of point defect diffusivity and recombination in ion beam deposition and combined ion and molecular deposition

N. Herbots, O. Vancauwenberghe, O. Hellman, 1991 .

Imaging of Buried Si and Si:Ge Surface Structure Under Amorphous Ge Films by Plan View Transmission Electron Microscopy

O. Hellman, 1994 .

Effect of Buried Surface Structure on Solid Phase Epitaxy of GE on SI (111)-7×7

O. Hellman, 1993 .

BURIED RECONSTRUCTION INHIBITION OF SOLID PHASE EPITAXY OF GE ON SI(111)

O. Hellman, 1994 .

Role of point defect diffusion and recombination in low-temperature growth of semiconductor heterostructures using low-energy ion beams

O. Vancauwenberghe, Nicole Herbots, O. C. Hellman, 1990, Other Conferences.

Calculation of grain boundary energies and structures in copper [001] twist boundaries using the modified embedded atom method

S. Tanaka, O. Hellman, A. Seki, 1996 .

Microstructure and stoichiometry dependence of ion beam nitrides as a function of energy and temperature: A comparative study between Si and SiGe

W. Croft, N. Herbots, R. Culbertson, 1992 .

Dynamical stabilization in delafossite nitrides for solar energy conversion

D. Gall, S. Khare, O. Hellman, 2018 .

Structure and properties of silicon nitride and SixGe1−x nitride prepared by direct low energy ion beam nitridation

W. Croft, N. Herbots, R. Culbertson, 1992 .