J. Fouéré

发表

Spatial and temporal impulse response of optical diffracting apertures

J. Fouéré, 1977 .

New infrared spectroscopic ellipsometer for low‐k dielectric characterization

C. Defranoux, P. Boher, J. Fouéré, 2003 .

A holographic, radial and lateral shear interferometer

C. Roychoudhuri, J. Fouéré, 1974 .

Spectroscopic ellipsometry (SE) and grazing X-ray reflectometry (GXR) analyses on tungsten carbide films for diffusion barrier in copper metallization schemes

H. Efstathiadis, M. Hatzistergos, J. Fouéré, 2004 .

Precise Characterization of Silicon on Insulator (SOI) and Strained Silicon on Si 1−x Ge x on Insulator (SSOI) Stacks with Spectroscopic Ellipsometry

J. Fouéré, Lianchao Sun, 2003 .

Holographic radial shear interferometer.

D Malacara, D. Malacara, J C Fouéré, 1974, Applied optics.

Holographic interferometers for optical testing

J. Fouéré, 1974 .

Wide-field imagery at the CFH telescope prime focus.

J. Lemonnier, E. Richardson, G. Odgers, 1982 .

High Resolution Imagery and Slitless Spectroscopy at the Prime Focus of the CFH Telescope

D. Salmon, E. Richardson, G. Odgers, 1982 .

Focusing errors in a collimating lens or mirror: use of a moiré technique.

D Malacara, D. Malacara, J C Fouéré, 1974, Applied optics.