A. Lucero

The Analysis and Measurement of Harmonics in the Vicinity of an HVDC Inverter

L. P. Crane, D. L. Carlson, G. T. Heydt, 1986 .

Optimized reliability test design to reduce uncertainties in reliability assessment

A. E. Lucero, Daeil Kwon, D. Kwon, 2012, 2012 IEEE 62nd Electronic Components and Technology Conference.

Accelerated stress testing methodology to risk assess silicon-package thermomechanical failure modes resulting from moisture exposure under use condition

Jun He, Min Pei, J. Hicks, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).